A BIRA algorithm for embedded memories with 2D redundancy

One technique to increase the yield of memories is to incorporate spare rows and/or columns into the main memory array. However, due to the long bit-line and word-line lengths in today's SOC technology, it is not efficient to replace faulty cells with a spare row or a spare column. Therefore, the redundant rows (columns) are divided into row (column) blocks, respectively. The reconfiguration is performed at the row (column) block level instead of the conventional row (column) level. We first propose a redundancy analysis algorithm suitable for built-in implementation or embedded memories with 2D redundancy - the extended local repair-most (ELRM) algorithm. Due to the efficient utilization of redundant rows/columns, the manufacturing yield and reliability can be improved significantly. Thereafter, a simulator is implemented with C language for evaluating the repair rates of the proposed algorithm. Simulation results show the proposed approach can increase the repair rate and fabrication yield significantly.

[1]  Shyue-Kung Lu,et al.  Novel fault-tolerant techniques for high capacity RAMs , 2001, Proceedings 2001 Pacific Rim International Symposium on Dependable Computing.

[2]  Keshab K. Parhi,et al.  Low power SRAM design using hierarchical divided bit-line approach , 1998, Proceedings International Conference on Computer Design. VLSI in Computers and Processors (Cat. No.98CB36273).

[3]  Sy-yen Kuo,et al.  Efficient Spare Allocation for Reconfigurable Arrays , 1987, IEEE Design & Test of Computers.

[4]  Shyue-Kung Lu.  Built-in self-repair techniques for embedded RAMs , 2003 .

[5]  H. Shinohara,et al.  A divided word-line structure in the static RAM and its application to a 64K full CMOS RAM , 1983, IEEE Journal of Solid-State Circuits.

[6]  Jin-Fu Li,et al.  Built-in redundancy analysis for memory yield improvement , 2003, IEEE Trans. Reliab..

[7]  Shyue-Kung Lu.  A Novel Built-In Self-Repair Approach for Embedded RAMs , 2003, J. Electron. Test..

[8]  W. Kent Fuchs,et al.  Efficient Spare Allocation for Reconfigurable Arrays , 1987 .

[9]  John R. Day.  A Fault-Driven, Comprehensive Redundancy Algorithm for Repair of Dynamic RAMs , 1984, ITC.

[10]  John Day.  A Fault-Driven, Comprehensive Redundancy Algorithm , 1985, IEEE Design & Test of Computers.

[11]  Yervant Zorian,et al.  2001 Technology Roadmap for Semiconductors , 2002, Computer.