论文信息 - Raman scattering studies on PZT thin films for trigonal-tetragonal phase transition

Raman scattering studies on PZT thin films for trigonal-tetragonal phase transition

PZT thin films were successfully prepared through sol-gel. The annealing temperature was confirmed through DTA analyzing. The trigonal and tetragonal phase transition was analyzed through Raman scattering. The intensity of the A1(2TO) mode and the A1(3TO)T mode were enhanced with the increase of the annealing temperature. So, the conclusions were obtained that the trigonal phase turned into a tetragonal phase as temperature increased.

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