SciPhon: a data analysis software for nuclear resonant inelastic X-ray scattering with applications to Fe, Kr, Sn, Eu and Dy
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W. Bi | E. Alp | Jung‐Fu Lin | A. Heard | Michael Y. Hu | N. Dauphas | F. Tissot | Jiyong Zhao | M. Roskosz | N. Nie | J. Hu | Erik M. Baker | Jin Liu