Impact of the Graded-Gap Layer on the Admittance of MIS Structures Based on MBE-Grown n-Hg1 – xCdxTe (x = 0.22–0.23) with the Al2O3 Insulator
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V. Vasil’ev | A. Voitsekhovskii | S. Dzyadukh | M. Yakushev | V. Varavin | S. Dvoretsky | N. Mikhailov | S. Nesmelov | G. Sidorov