The Random Testability of the n-Input AND Gate

Probabilistic testing is very attractive due to the low test generation costs. Unfortunately, not all circuits are well random testable. To eliminate this deficiency, biased random testing has been adopted. We distinguish input signal biased (ISB) random testing, where a distribution different from the uniform one is achieved by giving each primary input an individual signal probability, from pattern biased (PB) random testing, which allows an arbitrary distribution for the input patterns.