Circuit-level dictionaries of CMOS bridging faults

The contribution of this paper on the diagnosis (fault location) of CMOS bridging faults is threefold: First, the traditional fault dictionary (referred to as the full dictionary) is evaluated at the circuit level using a mixed-mode fault simulator. The fault set consists of randomly-generated gate input/output bridging faults. By using detection methods good diagnostic capability is achieved using only gate-level generated test sets. Second, the authors evaluate two reduced fault dictionaries, the pass/fail dictionary and the count dictionary. The results show the performance of the much smaller pass/fail dictionary is nearly equal to the full dictionary. Third, the effectiveness of I/sub DDQ/ for diagnosis is examined. The results show that I/sub DDQ/ combined with the proposed voltage detection methods achieves the highest diagnostic performance, with near complete diagnosis. >

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