Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility.
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B. Heinemann | C. Wimmer | M. Brombin | G. Orozco | M. Agostini | G. Serianni | F. Bonomo | M. Barbisan | R. Delogu | N. Harder | P. Veltri | A. Pimazzoni | U. Fantz | L. Schiesko | C. Poggi | M. Ugoletti | A. Mimo | A. Hurlbatt