Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique
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James Tschanz | Heather Quinn | Shekhar Borkar | Pascal Meinerzhagen | Qianying Tang | Vivek De | Chris H. Kim | Carlos Tokunaga | Andres Malavasi | Minki Cho | Hoonki Kim | Saurabh Kumar | Muhammad Khellah | Luke Eversen | Paul Mazanec | Dan Lake