Dynamic thermal characterization and modeling of packaged AlGaAs/GaAs HBTs

In this work we show a method for the thermal dynamic modeling of packaged HBTs. The method employs a calibration step featuring pulsed measurements at different temperatures, and is based upon a 3-stage thermal resistance-capacitance model that describes the chip-solder-case system. A current pulse generator was designed and assembled in-house for pulsed characterization down to the microsecond range. The model was used to simulate the thermal transients of the collector current from the microsecond range to hundreds of seconds, for several different bias points in the forward active region, consistently showing a good match with the measured characteristics.

[1]  H. Morkoç,et al.  Thermal design studies of high-power heterojunction bipolar transistors , 1989 .

[2]  J. P. Bailbe,et al.  Three-dimensional modeling of the heat flow into a GaAs substrate. Influence of thermal phenomena on the RF behavior of power HBTs and technological optimization , 1998 .

[3]  A. Samelis,et al.  Analysis of the large-signal characteristics of power heterojunction bipolar transistors exhibiting self-heating effects , 1997 .

[4]  Robert Fox,et al.  Thermal impedance extraction for bipolar transistors , 1996 .

[5]  William Liu,et al.  A survey of thermal-electric feedback coefficients in GaAs-based heterojunction bipolar transistors , 1995 .

[6]  J. Choma,et al.  Large signal modeling of HBT's including self-heating and transit time effects , 1992 .

[7]  K. Sakuno,et al.  Analytical model for electrical and thermal transients of self-heating semiconductor devices , 1998 .

[8]  J. P. Bailbe,et al.  Theory and experiment of the temperature dependence of GaAlAs/GaAs HBTs characteristics for power amplifier applications , 1995 .

[9]  Peter M. Asbeck,et al.  Determination of junction temperature in AlGaAs/GaAs heterojunction bipolar transistors by electrical measurement , 1992 .

[10]  Wen-Chau Liu,et al.  Measurement of junction temperature of an AlGaAs/GaAs heterojunction bipolar transistor operating at large power densities , 1995 .

[11]  Anders Rydberg,et al.  Extraction of thermal time constant in HBTs using small signal measurements , 1997 .

[12]  A. Gupta,et al.  CW measurement of HBT thermal resistance , 1992 .

[13]  Roberto Menozzi,et al.  Reliability Issue in Compound Semiconductor Heterojunction Devices , 1999 .

[14]  J. W. Sofia,et al.  Analysis of thermal transient data with synthesized dynamic models for semiconductor devices , 1994, Proceedings of the Technical Program. ELECTRO 99 (Cat. No.99CH36350).

[15]  R. Anholt,et al.  Thermal impedances of multi-finger heterojunction bipolar transistors , 1998 .

[16]  R. Anholt,et al.  HBT thermal element design using an electro/thermal simulator , 1998 .

[17]  M. G. Adlerstein,et al.  Thermal resistance measurements for AlGaAs/GaAs heterojunction bipolar transistors , 1991 .

[18]  Kenneth E. Mortenson,et al.  Transistor Junction Temperature as a Function of Time , 1957, Proceedings of the IRE.

[19]  A. Piccirillo,et al.  Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method , 1997 .

[20]  Roberto Menozzi,et al.  A study of the DC and RF degradation of Be-doped AlGaAs/GaAs HBTs under constant current stress , 1997, 1997 GaAs Reliability Workshop. Proceedings.

[21]  Robert Anholt,et al.  Electrical and thermal characterization of MESFETs, HEMTs, and HBTs , 1994 .

[22]  P. W. Webb,et al.  Use of the three-dimensional TLM method in the thermal simulation and design of semiconductor devices , 1992 .

[23]  Hadis Morkoç,et al.  Negative output differential resistance in AlGaAs/GaAs heterojunction bipolar transistors , 1992 .

[24]  Christophe Lallement,et al.  One-dimensional analytical modeling of the VDMOS transistor taking into account the thermoelectrical interactions , 1997 .

[25]  E. Zanoni,et al.  A simple method for the thermal resistance measurement of AlGaAs/GaAs heterojunction bipolar transistors , 1998 .

[26]  V. Székely,et al.  Fine structure of heat flow path in semiconductor devices: a measurement and identification method , 1988 .