Electrical, microstructural, physical and chemical characterization of HV XLPE cable peelings for an electrical aging diagnostic data base

The aim of the European project "ARTEMIS" is to develop a diagnostic system for assessing aging in power cable insulation. Its first task was to make a thorough characterisation of the cable insulation before aging. This is intended to provide a background against which any changes introduced by thermo-electric aging can be identified. The aging markers derived from this initial characterisation will be considered both as diagnostic indicators in their own right, and also to develop an aging model for predictive purposes, if and when possible. This stage of the ARTEMIS programme is now complete and we will present an analysis of the results, and show how they may be correlated with the concepts proposed in aging theories.

[1]  G. Stevens,et al.  Microstructural characterization of XLPE electrical insulation in power cables: determination of void size distributions using TEM , 2003 .

[2]  G. C. Montanari,et al.  Mobility estimation in polymeric insulation through space charge profiles derived by PEA measurements , 2002, Annual Report Conference on Electrical Insulation and Dielectric Phenomena.

[3]  Gilbert Teyssedre,et al.  Characterisation of crosslinked polyethylene materials by luminescence techniques , 2002 .

[4]  C. Laurent,et al.  Role of additives as recombination centres in polyethylene materials as probed by luminescence techniques , 2002 .

[5]  A. Campus,et al.  Deep trapping centers in crosslinked polyethylene investigated by molecular modeling and luminescence techniques , 2001 .

[6]  Gian Carlo Montanari,et al.  Charge distribution and electroluminescence in cross-linked polyethylene under dc field , 2001 .

[7]  Nicholas Quirke,et al.  Molecular modeling of electron traps in polymer insulators: Chemical defects and impurities , 2001 .

[8]  G. C. Montanari,et al.  The electrical degradation threshold of polyethylene investigated by space charge and conduction current measurements , 2000 .

[9]  G. Montanari,et al.  Multi-stress electrical and thermal ageing of HV extruded polymeric cables: Mechanisms and methods , 2000 .

[10]  N. Quirke,et al.  The Calculation of the Electron Affinity of Atoms and Molecules , 1999 .

[11]  C. Laurent,et al.  Optical prebreakdown warnings in insulating polymers , 1999 .

[12]  Sandro Scandolo,et al.  Interchain states and the negative electron affinity of polyethylene , 1998, 1998 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.98CH36257).

[13]  Julia Alison,et al.  A high field pulsed electro-acoustic apparatus for space charge and external circuit current measurement within solid insulators , 1998 .

[14]  R. N. Hampton,et al.  Thermoelectric ageing of cable grade XLPE in dry conditions , 1998, ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132).

[15]  C. Laurent,et al.  Optical pre-breakdown warnings in insulating polymers , 1998, ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132).

[16]  Jean-Pierre Crine,et al.  A molecular model to evaluate the impact of aging on space charges in polymer dielectrics , 1997 .

[17]  Gian Carlo Montanari,et al.  The role of trapped space charges in the electrical aging of insulating materials , 1997 .

[18]  R. N. Hampton,et al.  A new model for electrical ageing and breakdown in dielectrics , 1996 .

[19]  J. Densley,et al.  Ageing and diagnostics in extruded insulations for power cables , 1995, Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics.

[20]  C. Servant,et al.  Small‐angle X‐ray scattering study of precipitation in a Cu–2 at.% Co alloy , 1993 .

[21]  M. Urban,et al.  Attenuated total reflectance Fourier transform infra-red studies of crystalline-amorphous content on polyethylene surfaces , 1992 .

[22]  John C. Fothergill,et al.  Electrical degradation and breakdown in polymers , 1992 .

[23]  G. Zerbi,et al.  Structural depth profiling in polyethylene films by multiple internal reflection infra-red spectroscopy , 1989 .

[24]  Gian Carlo Montanari,et al.  Degradation and electrical behavior of aged XLPE cable models , 1989, Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics.

[25]  G. Strobl,et al.  Raman spectroscopic method for determining the crystallinity of polyethylene , 1978 .

[26]  A. Many,et al.  Theory of Transient Space-Charge-Limited Currents in Solids in the Presence of Trapping , 1962 .