Individual multiwalled boron nitride nanotubes of different diameters (40−100 nm) were bent inside a 300 kV high-resolution transmission electron microscope (TEM) using a new fully integrated TEM−atomic force microscope (AFM) piezodriven holder under continuous recording of force−piezodisplacement curves. The tubes were gently compressed in situ (i.e., inside the electron microscope) between a piezomovable aluminum wire and a silicon cantilever. Typically, bending stress values ranging from ∼100 to ∼260 MPa, and corresponding to elastic moduli of 0.5−0.6 TPa, were estimated. Tube gross failures were absent up to very large bending angles (in excess of 115°). Extending the bending angles beyond 30−40° resulted in the elastic deformation of BN nanotubes, which proceeded through the propagation of consecutive momentary kinks. These had the effect of accumulating a bending curvature rather then uniformly curl the tube under the compression load. These kinks were found to be entirely reversible on reloading wi...