On-chip analog signal generator for mixed-signal built-in self-test

A new method for generating analog signals with very low complexity and hardware requirements has recently been introduced. In this paper, two different silicon implementations are presented and their performance is analyzed through different experimental results. Various ways in which the generators can be used are also demonstrated. Emphasis is placed on the simplicity of the design process and its compact implementation, which are crucial considerations when implementing a Built-In Self-Test (BIST) strategy.

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