Synchrotron X-Ray Topography Study on the Relationship between Local Basal Plane Bending and Basal Plane Dislocations in PVT-Grown 4H-SiC Substrate Wafers
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G. Chung | M. Dudley | B. Raghothamachar | Hongyu Peng | Tuerxun Ailihumaer | I. Manning | E. Sanchez