Filtering of electron images of crystal defects

2014 The interpretation of electron micrographs becomes easier after filtering of the photographic and electronic noise. The filtering process can be optical or numerical. The use of mask in the Fourier space must not disturb too much the spectrum of the information of interest. The influence of four mask shapes is studied on two nearly similar test objects : atomic columns near the core of germanium crystal dislocations. The optimal mask shape is applied to a real electron micrograph of a high resolution electron image of dislocation. J. Physique 41 (1980) 565-571 JUlN 1980,