Long-finger HBT analysis based on device and EM co-simulation using FDTD method
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This paper presents an integrated analysis of a FDTD electromagnetic field simulation and a device simulation applying for HBT's having long-finger structure. The SPICE model extracting device parameter was used instead of physical model. As a result, the FDTD simulation results were the same tendency to measurement results. Additionally the comparison of gold line with lossless line as finger was shown.
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