PARCOURS - Substrate Crosstalk Analysis for Complex Mixed-Signal-Circuits

In integrated mixed-signal circuits signal integrity is affected by parasitic substrate coupling. Therefore, substrate crosstalk analysis has to be performed in layout verification. The PARasitic COUpling Model GeneratoR for Substrate (PARCOURS) applies a three-dimensional model for the substrate considering conductivity and permittivity if required. As a remarkable feature PARCOURS uses different levels of accuracy. The highest level integrates circuit elements with multiple substrate terminals in order to model the flow of parasitic currents in the vicinity of the die surface. The lowest level simplifies the substrate terminal as a point connection. A commercial videochip has been examined with the introduced approach.

[1]  N.P. van der Meijs,et al.  Extraction of circuit models for substrate cross-talk , 1995, Proceedings of IEEE International Conference on Computer Aided Design (ICCAD).

[2]  David J. Allstot,et al.  Verification techniques for substrate coupling and their application to mixed-signal IC design , 1996 .

[3]  Shoichi Masui,et al.  Experimental results and modeling techniques for substrate noise in mixed-signal integrated circuits , 1993 .

[4]  Rob A. Rutenbar,et al.  Addressing substrate coupling in mixed-mode ICs: simulation and power distribution synthesis , 1994, IEEE J. Solid State Circuits.

[5]  Andrew T. Yang,et al.  Integrated circuit substrate coupling models based on Voronoi tessellation , 1995, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[6]  M. Pfost,et al.  Modeling and measurement of substrate coupling in Si-bipolar IC's up to 40 GHz , 1998 .

[7]  Welch,et al.  A simple approach to modeling cross-talk in integrated circuits , 1993 .

[8]  Wen Wang,et al.  Chip Substrate Resistance Modeling Technique for Integrated Circuit Design , 1984, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[9]  Jacob K. White,et al.  Multilevel integral equation methods for the extraction of substrate coupling parameters in mixed-signal IC's , 1998, Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175).

[10]  Michael Ian Shamos,et al.  Computational geometry: an introduction , 1985 .

[11]  J. Lau,et al.  Experimental results and modeling of noise coupling in a lightly doped substrate , 1996, International Electron Devices Meeting. Technical Digest.

[12]  Robert G. Meyer,et al.  Modeling and analysis of substrate coupling in integrated circuits , 1996 .

[14]  Erich Barke,et al.  An extended bipolar transistor model for substrate crosstalk analysis , 1999, Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327).