论文信息 - Determination of Thickness and Optical Properties of Tantalum Oxide Thin Films by Spectroscopic Ellipsometry - 字舞流文

Determination of Thickness and Optical Properties of Tantalum Oxide Thin Films by Spectroscopic Ellipsometry

P. Chindaudom | K. Aiempanakit | P. Eiamchai | M. Horprathum | S. Limwichean | C. Chananonnawathorn | N. Khemasiri | T. Srichaiyaperk | B. Samransuksamer