‘ig,vgs’ Monitoring for Fast and Robust SiC MOSFET Short-Circuit Protection with High integration Capability
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Nicolas Rouger | Frédéric Richardeau | Yazan Barazi | François Boige | Jean-Marc Blaquiere | F. Richardeau | N. Rouger | F. Boige | J. Blaquière | Y. Barazi
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