Bivariate Lifetime Model for Organic Light-Emitting Diodes

Despite advantages of organic light-emitting diode (OLED) displays over liquid crystal displays, reliability concerns persist. These concerns must be addressed before OLED displays are widely adopted. In particular, existing methods are unable to reliably estimate the lifetime of large OLED displays (i.e., displays of 55 in or larger). This study proposes a novel model that incorporates physical and statistical uncertainty to estimate the lifetime of large OLED panels under normal usage conditions. A likelihood-ratio-based validation method is presented to determine the validity of the calculated model parameters. A bivariate acceleration model with two critical factors—temperature and luminance—is presented. The lifespan predicted by the proposed lifetime model shows a good agreement with the experimental results.

[1]  M. Shen,et al.  Experimental test and life estimation of the OLED at normal working stress based on the luminance degradation model. , 2015, Luminescence : the journal of biological and chemical luminescence.

[2]  Taehoon Kim,et al.  Symmetric Current-Balancing Circuit for LED Backlight With Dimming , 2012, IEEE Transactions on Industrial Electronics.

[3]  D. Stewart Peck,et al.  Comprehensive Model for Humidity Testing Correlation , 1986, 24th International Reliability Physics Symposium.

[4]  C. K. Michael Tse,et al.  Color Control System for RGB LED With Application to Light Sources Suffering From Prolonged Aging , 2014, IEEE Transactions on Industrial Electronics.

[5]  Shih-Mim Liu,et al.  Color Calibration for a Surrounding True-Color LED Display System by PWM Controls , 2014, IEEE Transactions on Industrial Electronics.

[6]  Peter Hanselaer,et al.  Optical determination of the junction temperature of OLEDs , 2013 .

[7]  William C. Lenhart,et al.  Operational degradation of organic light-emitting diodes: Mechanism and identification of chemical products , 2007 .

[8]  Tiago B. Marchesan,et al.  Solid-State Lighting: A Concise Review of the State of the Art on LED and OLED Modeling , 2015, IEEE Industrial Electronics Magazine.

[9]  Suk Joo Bae,et al.  Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests , 2010, IEEE Transactions on Reliability.

[10]  Yu Liu,et al.  Life prediction for white OLED based on LSM under lognormal distribution , 2012 .

[11]  JianPing Zhang,et al.  Constant-Step-Stress Accelerated Life Test of White OLED Under Weibull Distribution Case , 2012, IEEE Transactions on Electron Devices.

[12]  Masahiko Ishii Luminance Decay Mechanisms in Organic Light-Emitting Diodes , 2003 .

[13]  Jang‐Joo Kim,et al.  Substrate thermal conductivity effect on heat dissipation and lifetime improvement of organic light-emitting diodes , 2009 .

[14]  Bo-Wei Chen,et al.  Investigation of temperature-dependent asymmetric degradation behavior induced by hot carrier effect in oxygen ambiance in In-Ga-Zn-O thin film transistors , 2014 .

[15]  Guangbin Yang Accelerated Life Tests , 2007 .

[16]  N. Narendran,et al.  An Accelerated Test Method for Predicting the Useful Life of an LED Driver , 2011, IEEE Transactions on Power Electronics.

[17]  Chang-Ho Oh,et al.  50.1: Invited Paper: Technological Progress of Panel Design and Compensation Methods for Large‐Size UHD OLED TVs , 2014 .

[18]  András Poppe,et al.  Nonlinear electro-thermal modeling and field-simulation of OLEDs for lighting applications I: Algorithmic fundamentals , 2012, Microelectron. J..

[19]  LIKELIHOOD RATIO TESTS 1 0 . 1 Likelihood Ratio Tests , .

[20]  Byeng D. Youn,et al.  An empirical model to describe performance degradation for warranty abuse detection in portable electronics , 2015, Reliab. Eng. Syst. Saf..

[21]  Stephen R. Forrest,et al.  Transient analysis of organic electrophosphorescence: I. Transient analysis of triplet energy transfer , 2000 .

[22]  C. K. Michael Tse,et al.  Energy-Saving Driver Design for Full-Color Large-Area LED Display Panel Systems , 2014, IEEE Transactions on Industrial Electronics.

[23]  Kuei-Yu Lee,et al.  A New AMOLED Pixel Circuit With Pulsed Drive and Reverse Bias to Alleviate OLED Degradation , 2012, IEEE Transactions on Electron Devices.

[24]  Xiao Chen,et al.  Life prediction of OLED for constant-stress accelerated degradation tests using luminance decaying model , 2014 .

[25]  Hsiu-Ping Wei,et al.  Probabilistic Lifetime Prediction of Electronic Packages Using Advanced Uncertainty Propagation Analysis and Model Calibration , 2016, IEEE Transactions on Components, Packaging and Manufacturing Technology.

[26]  David Vaufrey,et al.  Physical mechanism responsible for the stretched exponential decay behavior of aging organic light-emitting diodes , 2005 .

[27]  C. R. Fincher,et al.  Clearing the Road to Mass Production of OLED Television Advanced material and process developments should help make printed OLED TVs commercially feasible. , 2011 .

[28]  Mikhail Nikulin,et al.  Advances in degradation modeling : applications to reliability, survival analysis, and finance , 2010 .

[29]  Gaudenzio Meneghesso,et al.  Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED , 2010, Microelectron. Reliab..

[30]  Fu-Kwun Wang,et al.  Lifetime predictions of LED-based light bars by accelerated degradation test , 2012, Microelectron. Reliab..

[31]  Santi Ranjan Pal,et al.  Likelihood Ratio Test , 2015 .

[32]  Chang-Ho Oh,et al.  21.1: Invited Paper: Technological Progress and Commercialization of OLED TV , 2013 .

[33]  R. Ma,et al.  Thermal behavior and indirect life test of large-area OLED lighting panels , 2014 .

[34]  Jin-seong Park,et al.  Review of recent developments in amorphous oxide semiconductor thin-film transistor devices , 2012 .

[35]  Chia-Che Hung,et al.  LTPS-TFT Pixel Circuit to Compensate for OLED Luminance Degradation in Three-Dimensional AMOLED Display , 2012, IEEE Electron Device Letters.

[36]  Byeng D. Youn,et al.  A framework of model validation and virtual product qualification with limited experimental data based on statistical inference , 2015 .

[37]  Fu-Kwun Wang,et al.  Useful lifetime of white OLED under a constant stress accelerated life testing , 2015 .

[38]  S. Cloupet,et al.  Reliability Estimation of Mechanical Components Using Accelerated Life Testing Models , 2010 .