Material-Insensitive Feature Depth Control and Machining Force Reduction by Ultrasonic Vibration in AFM-Based Nanomachining
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[1] Oleg Kolosov,et al. Ultrasound induced lubricity in microscopic contact , 1997 .
[2] O. Wright,et al. Ultrasonic force microscopy in waveguide mode up to 100 MHz , 1998, 1998 IEEE Ultrasonics Symposium. Proceedings (Cat. No. 98CH36102).
[3] Nicolas de Rooij,et al. Conductivity of SU‐8 Thin Films through Atomic Force Microscopy Nano‐Patterning , 2012 .
[4] Ultrasonic Machining at the Nanometer Scale , 2007 .
[5] A V Mitrofanov,et al. Ultrasonically assisted turning of aviation materials: simulations and experimental study. , 2004, Ultrasonics.
[6] S. Chou,et al. Nanoimprint Lithography , 2010 .
[7] A. Knoll,et al. Nanoscale Three-Dimensional Patterning of Molecular Resists by Scanning Probes , 2010, Science.
[8] H. Fujii,et al. Nanoscale friction reduction and fatigue monitoring due to ultrasonic excitation , 2003 .
[9] Hubert M. Pollock,et al. Interpretation of force curves in force microscopy , 1993 .
[10] Oleg Kolosov,et al. Ultrasonic force microscopy for nanometer resolution subsurface imaging , 1994 .
[11] Thomas A. Dow,et al. Review of vibration-assisted machining , 2008 .
[12] Chung-Feng Jeffrey Kuo,et al. Scratch direction and threshold force in nanoscale scratching using atomic force microscopes , 2011 .
[13] Christie R. K. Marrian,et al. Low voltage electron beam lithography in self‐assembled ultrathin films with the scanning tunneling microscope , 1994 .
[14] Zhaoning Yu,et al. Circuit fabrication at 17 nm half-pitch by nanoimprint lithography. , 2006, Nano letters.
[15] H Han Haitjema,et al. Deformation and wear of pyramidal, silicon-nitride AFM tips scanning micrometre-size features in contact mode , 1999 .
[16] Shen Dong,et al. Investigation on AFM-based micro/nano-CNC machining system , 2007 .
[17] C. Park,et al. Reliable and Improved Nanoscale Stencil Lithography by Membrane Stabilization, Blurring, and Clogging Corrections , 2011, IEEE Transactions on Nanotechnology.
[18] E. Snow,et al. Fabrication of Si nanostructures with an atomic force microscope , 1994 .
[19] Mark L. Schattenburg,et al. X-ray lithography from 500 to 30 nm: X-ray nanolithography , 1993, IBM J. Res. Dev..
[20] Dae-Eun Kim,et al. Characteristics of fracture during the approach process and wear mechanism of a silicon AFM tip. , 2005, Ultramicroscopy.
[21] Xu,et al. "Dip-Pen" nanolithography , 1999, Science.
[22] Li Zhang,et al. High-rate tunable ultrasonic force regulated nanomachining lithography with an atomic force microscope , 2012, Nanotechnology.
[23] Oleg Kolosov,et al. Analysis of Subsurface Imaging and Effect of Contact Elasticity in the Ultrasonic Force Microscope , 1994 .
[24] J. Brugger,et al. Reusability of nanostencils for the patterning of Aluminum nanostructures by selective wet etching , 2008 .
[25] S. Evans,et al. Gold nanoparticle patterning of silicon wafers using chemical e-beam lithography. , 2004, Langmuir : the ACS journal of surfaces and colloids.
[26] S. K. Biswas,et al. Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy , 2000 .
[27] Te-Hua Fang,et al. Effects of AFM-based nanomachining process on aluminum surface , 2003 .
[28] K. Katô,et al. Wear of the atomic force microscope tip under light load, studied by atomic force microscopy , 1995 .
[29] Xavier Borrisé,et al. Nanolithography on thin layers of PMMA using atomic force microscopy , 2005 .
[30] O. B. Ozdoganlar,et al. A Rotating-Tip-Based Mechanical Nano-Manufacturing Process: Nanomilling , 2010, Nanoscale Research Letters.
[31] H. R. J. R. V. Helleputte,et al. Generation of electrochemically deposited metal patterns by means of electron beam (nano)lithography of self‐assembled monolayer resists , 1994 .
[32] Koji Kato,et al. Nano-wear of the diamond AFM probing tip under scratching of silicon, studied by AFM , 1996 .
[33] R. V. Martinez,et al. Silicon nanowire transistor with a channel width of 4 nm fabricated by atomic force microscope nanolithography , 2009, 2009 9th IEEE Conference on Nanotechnology (IEEE-NANO).
[34] R. Williams,et al. Imaging the elastic nanostructure of Ge islands by ultrasonic force microscopy , 1998 .