The Effect of Errors in the Optical Monitoring of Narrow-band All-dielectric Thin Film Optical Filters
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Errors which occur during the deposition of thin film narrow-band optical filters can be classified as either static or dynamic. An approximate theory of the effects of these two types of error on turning value monitoring is developed and the results are used to devise a modification to the conventional technique which enables filter performance much nearer theoretical to be achieved.
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