Photothermal depth profiling: Analysis of reconstruction errors

The accuracy of photothermal depth profiling of the thermal conductivity profile of thermally inhomogeneous materials is discussed in detail. The reconstruction error is statistically analysed as a function of depth and noise, for different classes of profiles. The analysis is done in the framework of reconstructions obtained by a neural network approach, thermal wave backscattering theory and a method which is based on a statistical sampling of the chi-squared function in a restricted part of the profile space. The latter analysis yields confidence intervals for the reconstructions.

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