Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation
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A. Forchel | U. Pietsch | J. Reithmaier | J. Grenzer | S. Rennon | N. Darowski | A. Daniel
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A. Forchel | U. Pietsch | J. Reithmaier | J. Grenzer | S. Rennon | N. Darowski | A. Daniel