Yield Optimization in Electronic Circuits Design

In this work we propose an approach that combines a Support Vector learning Machine with a Derivative-Free black box optimization algorithm in order to maximize the yield in the production of electronic circuits. This approach is tested on a circuit provided by ST-Microelectronics, to be employed in consumer electronics. The results of the approach are compared with the results of WiCkeD, a commercial software largely used for integrated circuits analysis.

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