Research on generated mechanism of scattering characteristic of random rough dielectric surface

On the basis of electromagnetic theory, the scattering light intensity from a series of dielectric surfaces with different roughness is calculated by using monte-carlo method and the boundary condition of Kirchhoff approximation. The geometry profile of rough surfaces obeys Guass distribution and all of the surfaces have the same corelation length. With the increasing of rms height, the width of diffuse scattering intensity distribution, the attenuation of scattering peak value and its moving to the normal direction are observed. After theoretical analysis, it is obtained that the statistical distribution of the local slope varies with the rms height and reflecting index of these local slope are the main reasons for these phenomenon.