Oxide VCSEL reliability qualification at Agilent Technologies

In the past two years, Agilent Technologies has had a unique opportunity to study the reliability of VCSELs from most major manufacturers. We report on our methodology for qualifying prospective VCSEL suppliers, and briefly discuss our findings. The expected use environment for VCSELs is covered, along with VCSEL reliability limitations with existing technology. Differences between maverick and wearout failures are discussed, and examples of each are shown; VCSEL failure analysis is also briefly touched on. Finally, recent challenges in using oxide VCSELs in non-hermetic packaging, and 10 Gb/s operation, are briefly covered.

[1]  Chun Lei,et al.  Reliability of vertical-cavity lasers at Hewlett-Packard , 1999, Photonics West.

[2]  R. Waters,et al.  Dark-line observations in failed quantum well lasers , 1988 .

[3]  R. W. Herrick Reliability of fiber optic datacom modules at Agilent Technologies , 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).

[4]  P. Petroff,et al.  Gradual degradation in 850-nm vertical-cavity surface-emitting lasers , 1998 .

[5]  R. G. Waters,et al.  Diode laser degradation mechanisms: A review , 1991 .

[6]  Kent D. Choquette,et al.  Selective oxidation of buried AlGaAs versus AlAs layers , 1996 .

[7]  Bing Liang,et al.  Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies , 2000, Photonics West - Optoelectronic Materials and Devices.

[8]  P. Petroff,et al.  Degradation mechanisms of vertical cavity surface emitting lasers , 1996, Proceedings of International Reliability Physics Symposium.

[9]  Mary K. Hibbs-Brenner,et al.  Reliability of proton-implanted VCSELs for data communications , 1996, Photonics West.

[10]  T. Yuasa,et al.  Current Density Dependence for Dark-Line Defect Growth Velocity in Strained InGaAs / AlGaAs Quantum Well Laser Diodes , 1991 .

[11]  R. K. Bertaska,et al.  Degradation phenomenology in (Al)GaAs quantum well lasers , 1988 .

[12]  R. Herrick,et al.  Degradation in vertical cavity lasers , 1997 .

[13]  Jeff W. Scott,et al.  Analysis of VCSEL degradation modes , 1996, Photonics West.

[14]  Mary K. Hibbs-Brenner,et al.  Degradation studies of proton‐implanted vertical cavity surface emitting lasers , 1995 .

[15]  Hong Q. Hou,et al.  Production of high-speed oxide-confined VCSEL arrays for datacom applications , 2002, SPIE OPTO.