Spectroscopy of highly charged ions and its relevance to EUV and soft x-ray source development
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C. Suzuki | G. O'sullivan | Bowen Li | R. D’Arcy | P. Dunne | P. Hayden | D. Kilbane | T. McCormack | H. Ohashi | F. O’Reilly | P. Sheridan | E. Sokell | T. Higashiguchi | G. O’Sullivan