Scanning x‐ray microscope with 75‐nm resolution
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Ian McNulty | Harvey Rarback | David T. Attwood | Janos Kirz | Deming Shu | Harald Ade | Dieter Kern | N. Iskander | Y. Vladimirsky | J. Kirz | Y. Vladimirsky | I. McNulty | D. Kern | D. Attwood | H. Ade | K. Mcquaid | S. Rothman | D. Shu | H. Rarback | Kenneth R. McQuaid | T.H.P. Chang | S. Feng | T.H.P. Chang | N. Iskander | S. C. Feng | Stephen S. Rothman | T. Chang
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