New Permittivity Measurement Methods Using Resonant Phenomena For High-Permittivity Materials

This paper describes the characterization of high-permittivity materials with a dielectric constant (<inline-formula> <tex-math notation="LaTeX">$\epsilon _{r}$ </tex-math></inline-formula>) up to 3000 using resonant phenomena. We propose and demonstrate two types of measurement techniques: the rectangular resonator method by controlling the sample insertion length and the waveguide reflection method with a sample terminated by a short circuit. We investigate the validity and the range of application of both methods by performing numerical calculations. We also experimentally demonstrate these two methods by measuring dielectric materials with <inline-formula> <tex-math notation="LaTeX">$\epsilon _{r}$ </tex-math></inline-formula> ~100 and 200 for the former method and those with <inline-formula> <tex-math notation="LaTeX">$\epsilon _{r}$ </tex-math></inline-formula> ~200, 1400, 1700, and 2900 for the latter method. By estimating the measurement uncertainty using Monte Carlo calculations, we clarify that the results obtained by both methods for a dielectric material with <inline-formula> <tex-math notation="LaTeX">$\epsilon _{r}$ </tex-math></inline-formula> ~ 200 are almost consistent within the ranges of the uncertainties.