Development of the next generation 1700V trench-gate FS-IGBT

This paper describes the next generation 1700V trench-gate FS-IGBT utilized the micro p-base structure for the first time. The new 1700V IGBT has been achieved that “better turn-on di/dt controllability”, “oscillation free turn-off” and “improved Von-Eoff trade-off relationship” as well as 600V and 1200V IGBTs. Furthermore, the critical thermal runaway temperature has successfully been elevated by the newly developed field-stop layer, which leads to increase of maximum junction temperature as high as 175 deg. C.

[1]  N. Fujishima,et al.  A 600V super low loss IGBT with advanced micro-P structure for the next generation IPM , 2010, 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD).

[2]  T. Laska,et al.  The Field Stop IGBT (FS IGBT). A new power device concept with a great improvement potential , 2000, 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094).

[3]  Y. Onozawa,et al.  1200V FS-IGBT module with enhanced dynamic clamping capability , 2004, 2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs.

[4]  Y. Onozawa Development of the next generation 1200V trench-gate FS-IGBT featuring lower EMI noise and lower switching loss , 2007, Proceedings of the 19th International Symposium on Power Semiconductor Devices and IC's.

[5]  Ichiro Omura,et al.  A 4500 V injection enhanced insulated gate bipolar transistor (IEGT) operating in a mode similar to a thyristor , 1993, Proceedings of IEEE International Electron Devices Meeting.

[6]  Anton Mauder,et al.  1700 V-IGBT3: field stop technology with optimized trench structure $trend setting for the high power applications in industry and traction , 2002, Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics.

[7]  M. Yamaguchi,et al.  MOSFET-mode ultra-thin wafer PTIGBTs for soft switching application $theory and experiments , 2004, 2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs.