论文信息 - Two-Signal Method of Measuring the Large-Signal S-Parameters of Transistors

Two-Signal Method of Measuring the Large-Signal S-Parameters of Transistors

In this paper, large-signal S-parameters are reviewed, and transistors of Class-C are employed. Problems are encountered in obtaining large-signal parameters S/sub 12/ and S/sub 21/. A novel method is concisely developed based on theory presented herein. The acquired S-parameters are applied to amplifier design accordingly. The predicted and measured output power are compared, and suitable conclusions are duly recorded.

S. R. Mazumder | P. D. van der Puije

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