Noise measurement of YBa2Cu3O7-x and Ti2Ba2Ca2Cu3O10-x thin films
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Hoi Sing Kwok | Q. Y. Ying | Jim P. Zheng | S. Y. Dong | Jim P. Zheng | S. Liou | H. Kwok | S. H. Liou | Q. Ying | Jim P. Zheng
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