SPRITE: a modern approach to scanning probe contact resonance imaging
暂无分享,去创建一个
[1] Joseph A. Turner,et al. Atomic force acoustic microscopy methods to determine thin-film elastic properties , 2003 .
[2] Siqun Wang,et al. Nanoscale characterization of natural fibers and their composites using contact-resonance force microscopy , 2010 .
[3] Philip A. Yuya,et al. Viscoelastic property mapping with contact resonance force microscopy. , 2011, Langmuir : the ACS journal of surfaces and colloids.
[4] Kei Kobayashi,et al. Resonance tracking ultrasonic atomic force microscopy , 2002 .
[5] Keiichi Nakamoto,et al. Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy , 2001 .
[6] Ernst Meyer,et al. Modulation of contact resonance frequency accompanying atomic-scale stick–slip in friction force microscopy , 2009, Nanotechnology.
[7] Gheorghe Stan,et al. Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy , 2012, Nanotechnology.
[8] Gerold A. Schneider,et al. High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques , 2002 .
[9] K. Wolter,et al. Dual resonance excitation system for the contact mode of atomic force microscopy. , 2012, The Review of scientific instruments.
[10] S. Kalinin,et al. Dual-frequency resonance-tracking atomic force microscopy , 2007 .
[11] Anthony B. Kos,et al. Nanomechanical mapping with resonance tracking scanned probe microscope , 2007 .
[12] Jennifer Y. Kelly,et al. Quantitative subsurface contact resonance force microscopy of model polymer nanocomposites , 2011, Nanotechnology.
[13] Bryan D. Huey,et al. AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping , 2007 .
[14] J. Killgore,et al. Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy , 2012, Nanotechnology.
[15] Gheorghe Stan,et al. Quantitative measurements of indentation moduli by atomic force acoustic microscopy using a dual reference method , 2006 .
[16] R. Olmon,et al. Antenna–load interactions at optical frequencies: impedance matching to quantum systems , 2012, Nanotechnology.
[17] P. Girard,et al. Image processing for resonance frequency mapping in atomic force modulation microscopy. , 2007, The Review of scientific instruments.
[18] Stephen Jesse,et al. The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale , 2007, 0708.4248.