Investigation of Thermal Neutron Induced Soft Error Rates in Commercial Srams with 0.35 μm to 90 nm Technologies

Measurement of soft error rates (SER) often commercial SRAMs of 0.35 μm to 90 nm technologies have been completed at the Institut Laue-Langevin (ILL) neutron facility. Results establish the sensitivity of old and recent SRAM technologies showing the impact of 10B concentrations in BPSG and p-type regions. 10B results are also compared to high-energy neutron SER

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