Electrical Characterization of La2O3-Gated Metal Oxide Semiconductor Field Effect Transistor with Mg Incorporation
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Hiroshi Iwai | Nobuyuki Sugii | Kuniyuki Kakushima | Parhat Ahmet | Kazuo Tsutsui | Takeo Hattori | K. Tachi | K. Okamoto | T. Koyanagi
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