Quantitative chemical phase analysis of EFTEM elemental maps using scatter diagrams

Abstract Energy-filtered transmission electron microscope (EFTEM) images can yield elemental maps of very high lateral resolution (1–2 nm) in a short time (typically less than 3 min). Additionally, correlation techniques such as scatter diagrams yield information about the intensity relationships between the various elemental maps, thus leading to the calculation of chemical phase maps. The application of such techniques reduces the amount of data (i.e. number of images) by compressing information of different images into only a few. This makes interpretation a lot easier and clearer, since information in chemical phase maps is restricted to the chemical composition of the specimen. In this work we used a Gatan Imaging Filter (GIF) to acquire EFTEM images of a BaNd-titanate specimen. The scatter diagram technique together with quantification procedures was then applied to these images in order to show the distribution of chemical phases within the specimen. First, we quantified the elemental maps using atomic ratio images. Then we applied the scatter diagram technique on the atomic ratio images and calculated chemical phase maps.

[1]  O. Krivanek,et al.  Applications of a post-column imaging filter in biology and materials science. , 1993, Ultramicroscopy.

[2]  H. Kohl,et al.  Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope , 1993 .

[3]  D. E. Newbury,et al.  Concentration histogram imaging: A scatter diagram technique for viewing two or three related images , 1991 .

[4]  N Bonnet,et al.  Developments in processing image sequences for elemental mapping. , 1988, Scanning microscopy. Supplement.

[5]  P. Golob,et al.  Quantification of electron energy-loss spectra with K and L shell ionization cross-sections , 1988 .

[6]  F. Hofer Determination of inner-shell cross-sections for EELS-quantification , 1991 .

[7]  W. Stobbs,et al.  Elastic scattering in EELS-fundamental corrections to quantification , 1985 .

[8]  D. Peacock,et al.  Scatter diagrams in energy analysed digital imaging: application to scanning Auger microscopy , 1987 .

[9]  O. Krivanek,et al.  Developments in EELS instrumentation for spectroscopy and imaging , 1991 .

[10]  O. Krivanek,et al.  Design and first applications of a post-column imaging filter , 1992 .

[11]  M. Nelhiebel,et al.  Diffraction effects in electron spectroscopic imaging , 1996 .

[12]  E. S. Gelsema,et al.  Quantitative electron spectroscopic imaging in bio‐medicine: Methods for image acquisition, correction and analysis , 1994 .

[13]  W. Grogger,et al.  Imaging of nanometer-sized precipitates in solids by electron spectroscopic imaging , 1995 .

[14]  W. Ruijter Imaging properties and applications of slow-scan charge-coupled device cameras suitable for electron microscopy , 1995 .

[15]  W. Grogger,et al.  On the application of energy filtering TEM in materials science: I. Precipitates in a Ni/Cr-alloy , 1995 .

[16]  M. Nelhiebel,et al.  Diffraction effects in inner‐shell ionization edges , 1996 .

[17]  D. Johnson Energy Loss Spectrometry for Biological Research , 1979 .

[18]  David C. Joy,et al.  Introduction to analytical electron microscopy , 1979 .

[19]  G. Kothleitner,et al.  Quantitative analysis of EFTEM elemental distribution images , 1997 .

[20]  L. Reimer,et al.  Energy-filtering transmission electron microscopy in materials science , 1992 .

[21]  J. Mayer,et al.  Detection limits in elemental distribution images produced by energy filtering TEM: case study of grain boundaries in Si3N4 , 1994 .

[22]  R. Egerton Electron Energy-Loss Spectroscopy in the Electron Microscope , 1995, Springer US.

[23]  F. Hofer,et al.  Improved imaging of secondary phases in solids by energy-filtering TEM , 1996 .

[24]  M. Prutton,et al.  Scatter diagrams and hotelling transforms: application to surface analytical microscopy , 1990 .