A 288K CMOS pseudostatic RAM

A 288-kb pseudostatic RAM with high density and ease of use has been fabricated using polycide-gate n-well CMOS technology. For high speed and low power dissipation, a half-V/SUB cc/ precharging scheme, with CMOS back biased to V/SUB BB/, was used. For easier use, an address transition detector, plus auto-refresh and self-refresh, were adopted. Organized as 32K/spl times/9 bits, the RAM occupies an area of 55 mm/SUP 2/ and has a cell size of 6.8/spl times/13.6 /spl mu/m/SUP 2/, which was achieved using the 2-/spl mu/m design rule. A typical address access time is 125 ns, and the operating current is 60 mA at a 125-ns cycle time. Standby power is 2 mA.

[1]  S. Stern,et al.  A 70 ns high density 64K CMOS dynamic RAM , 1983, IEEE Journal of Solid-State Circuits.

[2]  T. Yabu,et al.  A 64K DRAM with 35 ns static column operation , 1983, IEEE Journal of Solid-State Circuits.

[3]  T. Mano,et al.  A 256K dynamic MOS RAM with alpha immune and redundancy , 1982 .

[4]  Y. Kamigaki,et al.  An n-Well CMOS Dynamic RAM , 1982, IEEE Journal of Solid-State Circuits.