SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate
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E. Blackmore | V. Ferlet-Cavrois | F. Wrobel | G. Spiezia | F. Saigné | R. Gaillard | C. Poivey | J. Mekki | K. Røed | R. G. Alía | M. Brugger | S. Uznanski | S. Danzeca | M. Trinczek
[1] C. Poivey,et al. Model of single event upsets induced by space protons in electronic devices , 1995, Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems.
[2] Stephen A. Wender,et al. Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model , 1995, Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95).
[3] S. Duzellier,et al. The potential of the radiation effects investigations on the accelerator facilities at Gatchina , 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).
[4] R. Harboe-Sorensen,et al. Radiation effects testing facilities in PSI during implementation of the Proscan project , 2002, IEEE Radiation Effects Data Workshop.
[5] J. Barth,et al. Space, atmospheric, and terrestrial radiation environments , 2003 .
[6] E. Blackmore,et al. LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics , 2003 .
[7] C. Dyer,et al. An atmospheric radiation model based on response matrices generated by detailed Monte Carlo Simulations of cosmic ray interactions , 2004, IEEE Transactions on Nuclear Science.
[8] G. L. Hash,et al. Effects of particle energy on proton-induced single-event latchup , 2005, IEEE Transactions on Nuclear Science.
[9] A. Ferrari,et al. FLUKA: A Multi-Particle Transport Code , 2005 .
[10] C. Dyer,et al. Neutron-Induced Single Event Effects Testing Across a Wide Range of Energies and Facilities and Implications for Standards , 2006, IEEE Transactions on Nuclear Science.
[11] P. Dodd,et al. Effects of Angle of Incidence on Proton and Neutron-Induced Single-Event Latchup , 2006, IEEE Transactions on Nuclear Science.
[12] R. Harboe-Sørensen,et al. Upgrades for the RADEF Facility , 2007, 2007 IEEE Radiation Effects Data Workshop.
[13] M. Simons,et al. Hardness Assurance Test Guideline for Qualifying Devices for Use in Proton Environments , 2009, IEEE Transactions on Nuclear Science.
[14] peixiong zhao,et al. Evidence for Lateral Angle Effect on Single-Event Latchup in 65 nm SRAMs , 2009, IEEE Transactions on Nuclear Science.
[15] Eugene Normand,et al. Cross Comparison Guide for Results of Neutron SEE Testing of Microelectronics Applicable to Avionics , 2010, 2010 IEEE Radiation Effects Data Workshop.
[16] N. Hooten,et al. The Effect of High-Z Materials on Proton-Induced Charge Collection , 2010, IEEE Transactions on Nuclear Science.
[17] V. Boccone,et al. FLUKA Simulations for SEE Studies of Critical LHC Underground Areas , 2011, IEEE Transactions on Nuclear Science.
[18] R Harboe-Sorensen,et al. The Technology Demonstration Module On-Board PROBA-II , 2011, IEEE Transactions on Nuclear Science.
[19] E. Lorfèvre,et al. Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing , 2011, IEEE Transactions on Nuclear Science.
[20] F. Wrobel,et al. SEU Measurements and Simulations in a Mixed Field Environment , 2013, IEEE Transactions on Nuclear Science.
[21] V. Ferlet-Cavrois,et al. SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams , 2013, IEEE Transactions on Nuclear Science.
[22] V. Ferlet-Cavrois,et al. Energy Dependence of Tungsten-Dominated SEL Cross Sections , 2014, IEEE Transactions on Nuclear Science.