Suppression of Switching-Field Variation by Surface Oxidation Depending on the Shape of the CoFeB Free Layer
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S. Ueno | T. Takenaga | Y. Tokuda | J. Tsuchimoto | T. Kuroiwa | H. Takada | Y. Abe | R. Matsuda
[1] H. Hada,et al. Reduction of switching field distributions by edge oxidization of submicron magnetoresistive tunneling junction cells for high-density magnetoresistive random access memories , 2006 .
[2] J. Daughton,et al. 70% TMR at room temperature for SDT sandwich junctions with CoFeB as free and reference Layers , 2004, IEEE Transactions on Magnetics.
[3] I. Baek,et al. Key factors to enhance the switching characteristics in submicron MRAM cells , 2004, IEEE Transactions on Magnetics.
[4] W. Kula,et al. Magnetic tunnel junction pattern technique , 2003 .
[5] Koichiro Inomata,et al. Size-independent spin switching field using synthetic antiferromagnets , 2003 .
[6] P. Freitas,et al. Synthetic ferrimagnet free layer tunnel junction for magnetic random access memories , 2002 .
[7] Saied N. Tehrani,et al. Switching characteristics and magnetization vortices of thin-film cobalt in nanometer-scale patterned arrays , 2000 .
[8] S. Tehrani,et al. End Domain States and Magnetization Reversal in Submicron Magnetic Structures , 1998, 7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275).
[9] Saied N. Tehrani,et al. Submicron spin valve magnetoresistive random access memory cell , 1997 .