Integration of non-classical faults in standard March tests

New fault models like the unrestored write and the false write through faults and suitable test algorithms have recently been developed by several authors. These tests are applied in addition to March tests. Since a March test algorithm can be implemented in many different ways and still be effective in detecting its target faults, we have what we call degrees of freedom in the test space. In this paper it is shown, that for commonly used memory organizations tests for the unrestored write and false write through faults can be integrated in March test sequences. It is shown how to design address sequence generators and address dependent data for March tests, that generate all the patterns required for the detection of those faults. The detection properties of the original March tests are retained. The additional overhead in terms of silicon area and timing for an on-chip realization of a built-in March self-test with the added fault detection features is negligible and the test application time remains unchanged.