Breakdown of dynamic scaling in surface growth under shadowing.
暂无分享,去创建一个
[1] J. Wendelken,et al. EVOLUTION OF MOUND MORPHOLOGY IN REVERSIBLE HOMOEPITAXY ON CU(100) , 1997 .
[2] Toh-Ming Lu,et al. Growth-front roughening in amorphous silicon films by sputtering , 2001 .
[3] V. Ganesan,et al. Dynamic scaling in growth of platinum films on Si(100) , 2000 .
[4] A. Silfhout,et al. Kinetic roughening of vicinal Si( 001) , 1994 .
[5] David M. Tanenbaum,et al. Surface roughening during plasma-enhanced chemical-vapor deposition of hydrogenated amorphous silicon on crystal silicon substrates , 1997 .
[6] R. Roy,et al. Evolutionary Growth Development in SiC Sputtered Films , 1984 .
[7] Evidence for power-law dominated noise in vacuum deposited CaF2. , 2004, Physical review letters.
[8] Sander,et al. Stable and unstable growth in molecular beam epitaxy. , 1994, Physical review letters.
[9] Morphology transition during low-pressure chemical vapor deposition. , 2001, Physical review letters.
[10] F. Family. Scaling of rough surfaces: effects of surface diffusion , 1986 .
[11] A. Barabasi,et al. Fractal Concepts in Surface Growth: Frontmatter , 1995 .
[12] Toh-Ming Lu,et al. Characterization of Amorphous and Crystalline Rough Surface: Principles and Applications , 2001 .
[13] T. Karabacak,et al. Growth front roughening in silicon nitride films by plasma-enhanced chemical vapor deposition , 2002 .
[14] A. Barabasi,et al. Fractal concepts in surface growth , 1995 .
[15] Tamás Vicsek,et al. Scaling of the active zone in the Eden process on percolation networks and the ballistic deposition model , 1985 .
[16] Alain Marty,et al. Instabilities in crystal growth by atomic or molecular beams , 2000 .
[17] Guo,et al. Shadowing instability in three dimensions. , 1993, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics.
[18] Shaw,et al. Scaling theory for the growth of amorphous films. , 1990, Physical review letters.
[19] N. Suresh,et al. A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering , 2000 .
[20] Dynamics of rough interfaces in chemical vapor deposition: experiments and a model for silica films , 2000, Physical review letters.