In situ biasing and off-axis electron holography of a ZnO nanowire
暂无分享,去创建一个
E. Monroy | F. Donatini | J. Pernot | V. Sallet | C. Sartel | M. D. den Hertog | R. McLeod
[1] F. Donatini,et al. Electron beam dose dependence of surface recombination velocity and surface space charge in semiconductor nanowires , 2017, Nanotechnology.
[2] K. Kavanagh,et al. Direct Measurement of the Electrical Abruptness of a Nanowire p-n Junction. , 2016, Nano letters.
[3] P. Tchoulfian,et al. Comparison of Three E-Beam Techniques for Electric Field Imaging and Carrier Diffusion Length Measurement on the Same Nanowires. , 2016, Nano letters.
[4] M. Borgström,et al. Doping GaP Core-Shell Nanowire pn-Junctions: A Study by Off-Axis Electron Holography. , 2015, Small.
[5] F. Donatini,et al. Metallic core conduction in unintentionally doped ZnO nanowire , 2015 .
[6] H. Lichte,et al. Nanometer-scale tomographic reconstruction of three-dimensional electrostatic potentials in GaAs/AlGaAs core-shell nanowires , 2014, 1407.1781.
[7] M. Malac,et al. Phase measurement error in summation of electron holography series. , 2014, Ultramicroscopy.
[8] A. Lenk,et al. Tomographic investigation of fermi level pinning at focused ion beam milled semiconductor surfaces , 2013 .
[9] Q. Ramasse,et al. Factors that determine and limit the resistivity of high-quality individual ZnO nanowires , 2013, Nanotechnology.
[10] M. Beleggia,et al. The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement , 2013, Microscopy and Microanalysis.
[11] S. Senz,et al. Colossal injection of catalyst atoms into silicon nanowires , 2013, Nature.
[12] Yeonwoong Jung,et al. Silicon nanowires: electron holography studies of doped p–n junctions and biased Schottky barriers , 2013, Nanotechnology.
[13] Lars Samuelson,et al. Spatially resolved Hall effect measurement in a single semiconductor nanowire. , 2012, Nature nanotechnology.
[14] E. Monroy,et al. Correlation of polarity and crystal structure with optoelectronic and transport properties of GaN/AlN/GaN nanowire sensors. , 2012, Nano letters.
[15] F. Bechstedt,et al. Structural, electrical, and optical properties of hydrogen-doped ZnO films , 2012 .
[16] Wen Guo,et al. Size dependence of dielectric constant in a single pencil-like ZnO nanowire. , 2012, Nano letters.
[17] F. Donatini,et al. Carrier depletion and exciton diffusion in a single ZnO nanowire , 2011, Nanotechnology.
[18] A. F. Moses,et al. Correlated micro-photoluminescence and electron microscopy studies of the same individual heterostructured semiconductor nanowires , 2011, Nanotechnology.
[19] David J. Smith,et al. Observation of hole accumulation in Ge/Si core/shell nanowires using off-axis electron holography. , 2011, Nano letters.
[20] F. Donatini,et al. A single-step electron beam lithography of buried nanostructures using cathodoluminescence imaging and low temperature , 2010, Nanotechnology.
[21] Robert A. McLeod,et al. Basic questions related to electron-induced sputtering in the TEM , 2010 .
[22] F. Bertin,et al. TEM specimen preparation by Au+, Ga+, Si+ and Si++ focused ion beams for off-axis electron holography , 2010 .
[23] Zhong Lin Wang,et al. Self-powered nanowire devices. , 2010, Nature nanotechnology.
[24] Rafal E. Dunin-Borkowski,et al. Dopant profiling of focused ion beam milled semiconductors using off-axis electron holography; reducing artifacts, extending detection limits and reducing the effects of gallium implantation , 2010 .
[25] J. Myoung,et al. Junction properties of Au/ZnO single nanowire Schottky diode , 2010 .
[26] H. Riel,et al. Off axis holography of doped and intrinsic silicon nanowires: Interpretation and influence of fields in the vacuum , 2010 .
[27] H. Riel,et al. Mapping active dopants in single silicon nanowires using off-axis electron holography. , 2009, Nano letters.
[28] Zhong Lin Wang,et al. Equilibrium piezoelectric potential distribution in a deformed ZnO nanowire , 2009 .
[29] Lianmao Peng,et al. Observation of a 2D Electron Gas and the Tuning of the Electrical Conductance of ZnO Nanowires by Controllable Surface Band‐Bending , 2009 .
[30] M. Malac,et al. Basic Questions Related to Electron-Induced Sputtering , 2009, Microscopy and Microanalysis.
[31] Peter Liljeroth,et al. Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy , 2009, Science.
[32] C. Delerue,et al. Probing the Carrier Capture Rate of a Single Quantum Level , 2008, Science.
[33] C. Lieber,et al. Visualization of carrier depletion in semiconducting nanowires. , 2007, Small.
[34] R. Truche,et al. Medium resolution off-axis electron holography with millivolt sensitivity , 2007 .
[35] R. Zelsacher,et al. A novel SIMS based approach to the characterization of the channel doping profile of a trench MOSFET , 2007, Microelectron. Reliab..
[36] D. Gerthsen,et al. Increase of the mean inner Coulomb potential in Au clusters induced by surface tension and its implication for electron scattering , 2007, 0705.1065.
[37] Kazuo Yamamoto,et al. Electron holographic observation of micro-magnetic fields current-generated from single carbon coil. , 2006, Ultramicroscopy.
[38] Jayhoon Chung,et al. Mapping of electrostatic potentials within core-shell nanowires by electron holography , 2006 .
[39] A. Wieck,et al. Depletion characteristics of two-dimensional lateral p‐n-junctions , 2005 .
[40] Henryk Temkin,et al. Size-dependent surface luminescence in ZnO nanowires , 2004 .
[41] Yimei Zhu,et al. Fast phase unwrapping algorithm for interferometric applications. , 2003, Optics letters.
[42] Chris G. Van de Walle,et al. Universal alignment of hydrogen levels in semiconductors, insulators and solutions , 2003, Nature.
[43] P. Midgley,et al. Quantitative electron holography of biased semiconductor devices. , 2002, Physical review letters.
[44] P. H. Citrin,et al. Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si , 2002, Nature.
[45] Midgley,et al. An introduction to off-axis electron holography , 2001, Micron.
[46] V. Walle,et al. Hydrogen as a cause of doping in zinc oxide , 2000 .
[47] Blavette,et al. Three-dimensional atomic-scale imaging of impurity segregation to line defects , 1999, Science.
[48] Peter Schwander,et al. TWO-DIMENSIONAL MAPPING OF THE ELECTROSTATIC POTENTIAL IN TRANSISTORS BY ELECTRON HOLOGRAPHY , 1999 .
[49] West,et al. Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges , 1997, Science.
[50] Lawrence F. Allard,et al. A software package for the processing and reconstruction of electron holograms , 1995 .
[51] D. Blavette,et al. An atom probe for three-dimensional tomography , 1993, Nature.
[52] M. Wells,et al. Occurrence of small colloids in sea water , 1991, Nature.
[53] S. Yamaoka,et al. High-Temperature Cubic Boron Nitride P-N Junction Diode Made at High Pressure , 1987, Science.
[54] J. Pethica,et al. Techniques: Scanning tunnelling microscopy , 1983, Nature.
[55] H. Grubin. The physics of semiconductor devices , 1979, IEEE Journal of Quantum Electronics.
[56] I. Lindau,et al. New and unified model for Schottky barrier and III–V insulator interface states formation , 1979 .
[57] A. Yoffe,et al. Monochromatic Cathodoluminescence Image in the Scanning Electron Microscope , 1969, Nature.
[58] U. Gösele,et al. Carrier profiling of individual Si nanowires by scanning spreading resistance microscopy. , 2010, Nano letters.
[59] den Hertog,et al. Caractérisation de nanofils de silicium par microscope électronique en transmission , 2009 .
[60] Zhong Lin Wang,et al. Microfibre–nanowire hybrid structure for energy scavenging , 2009, Nature.
[61] P. Batson,et al. Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity , 1993, Nature.