Scanning transmission electron microscopy : imaging and analysis
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Electron Optics and Aberration Correction. -Fundamentals of Scattering Theory. -Image formation in STEM. -Electron energy loss spectroscopy. -Energy dispersive x-ray analysis. -STEM of complex oxides. -STEM of complex alloys. -STEM of catalysts. -STEM of semiconductor devices. -STEM of ceramic materials. -STEM of quasicrystals. -STEM of nanomaterials. -3D STEM: tomography. -3D STEM: depth slicing. -Nanobeam diffraction.