Repair of redundant memories by reduced covering

In the proposed approach, repair is implemented by deletion of either rows and/or columns on which faulty cells lie. These devices are commonly referred to as redundant memories, because redundant columns and rows are added. The repair algorithm is based on a fault counting technique and on a reduced covering approach. The innovative feature is that reduced covering permits an heuristic, but efficient criterion to be included in the selection of the rows and/or columns to be deleted.<<ETX>>

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