Exploiting Parallelism in Leaf-Macro Access

The Macro Test concept provides a route from IC design to a set of leaf-macro test specifications. The major steps to follow are test plan generation, test pattern generation, and test pattern insertion; see Chapter 3. The test specifications contain the information of where to apply and observe given data at a specified time frame. A complete device test specification is produced by merging all leaf-macro test specifications. This process is called test assembly; see Chapter 3.