Simulation Studies of Test Nodes Selection for Soft Fault Diagnosis in Analog Circuits

Based on the slope fault mode and the coefficient of linear relativity fault mode, a test nodes selection algorithm for soft fault diagnosis dictionary method of analog circuits was proposed. Considering the single faults and double faults in the circuits, the slopes and the coefficients of linear relativity were utilized which were calculated from node-voltage increments as unified fault features respectively to establish fault dictionary. PSPICE simulation tool was used to simulate the fault states of the circuit, and the eigenfunction was used to describe the differences between every two unified features, the algorithm and approach of test nodes selection was proposed according to the fault isolation ability. Finally, simulation results demonstrate to validate the efficiency of the test nodes selection method.