Progress in scanning probe microscopy

Abstract In the past decade, the field of microscopy has been revolutionized by the introduction of a range of microscopies—scanning probe microscopes that are capable of measuring physical and chemical properties on the nanoscale. These microscopes—which were stimulated by the scanning tunneling microscope—have had a major impact on the understanding of material surfaces. The development of the key concepts of scanning probe microscopes is reviewed from their early history to current technologies. Some key applications of scanning probe microscopes are presented and the future advances that are likely to come to fruition in the next decade are discussed.

[1]  D. Sarid,et al.  Compact scanning-force microscope using a laser diode. , 1988, Optics letters.

[2]  H. K. Wickramasinghe,et al.  High Resolution Thermal Microscopy , 1986, IEEE 1986 Ultrasonics Symposium.

[3]  Y. Martin,et al.  Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution , 1995, Science.

[4]  Hemantha K. Wickramasinghe,et al.  High‐resolution magnetic imaging of domains in TbFe by force microscopy , 1988 .

[5]  H. Kumar Wickramasinghe,et al.  High‐resolution capacitance measurement and potentiometry by force microscopy , 1988 .

[6]  Albert V. Baez Is Resolving Power Independent of Wavelength Possible? An Experiment with a Sonic “Macroscope” , 1956 .

[7]  R. Feenstra,et al.  Tunneling spectroscopy of the GaAs(110) surface , 1987 .

[8]  J. E. Stern,et al.  Deposition and imaging of localized charge on insulator surfaces using a force microscope , 1988 .

[9]  Stroscio,et al.  Electronic structure of the Si(111)2 x 1 surface by scanning-tunneling microscopy. , 1986, Physical review letters.

[10]  M. Isaacson,et al.  Development of a 500 Å spatial resolution light microscope: I. light is efficiently transmitted through λ/16 diameter apertures , 1984 .

[11]  E. Abbe Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung , 1873 .

[12]  H. K. Wickramasinghe,et al.  ATOMIC FORCE MICROSCOPY OF WORK FUNCTIONS ON THE NANOMETER SCALE , 1999 .

[13]  Bruce J. Hunt,et al.  The Continuous Wave: Technology and American Radio, 1900-1932 , 1985 .

[14]  H. K. Wickramasinghe,et al.  Microscopy of chemical-potential variations on an atomic scale , 1990, Nature.

[15]  Yves Martin,et al.  High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry , 1988, Photonics West - Lasers and Applications in Science and Engineering.

[16]  Suzuki,et al.  Generation of microwave radiation in the tunneling junction of a scanning tunneling microscope. , 1990, Physical review. B, Condensed matter.

[17]  R. F. Humphryes,et al.  Acoustic-surface-wave amplitude and phase measurements using laser probes , 1972 .

[18]  Hemantha K. Wickramasinghe,et al.  Atomic force microscope–force mapping and profiling on a sub 100‐Å scale , 1987 .

[19]  J. M. Drake,et al.  Special Issue: Dynamics of Molecular Systems , 1990 .

[20]  H. K. Wickramasinghe,et al.  Optical absorption microscopy and spectroscopy with nanometre resolution , 1989, Nature.

[21]  C. Quate,et al.  Atomic resolution with the atomic force microscope on conductors and nonconductors , 1988 .

[22]  D. Sarid Scanning Force Microscopy: With Applications To Electric, Magnetic, And Atomic Forces , 1991 .

[23]  D. Thompson,et al.  Review of Progress in Quantitative Nondestructive Evaluation , 1982 .

[24]  Y. Martin,et al.  Optical data storage read out at 256 Gbits/in.2 , 1997 .

[25]  E. Ash,et al.  Super-resolution Aperture Scanning Microscope , 1972, Nature.

[26]  H. K. Wickramasinghe,et al.  Kelvin probe force microscopy , 1991 .

[27]  D. Abraham,et al.  High resolution atomic force microscopy potentiometry , 1991 .

[28]  Y. Martin,et al.  Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution , 1987 .

[29]  J. O'keefe,et al.  Resolving Power of Visible Light , 1956 .

[30]  R. Wiesendanger Scanning Probe Microscopy and Spectroscopy: Contents , 1994 .

[31]  Hamers,et al.  Atomically resolved carrier recombination at Si(111)-7 x 7 surfaces. , 1990, Physical review letters.

[32]  J. E. Stern,et al.  Force microscopy of magnetization patterns in longitudinal recording media , 1988 .

[33]  Bell,et al.  Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy. , 1988, Physical review letters.

[34]  Wild,et al.  Near-field optical spectroscopy of individual molecules in solids. , 1994, Physical review letters.

[35]  Paul Muralt,et al.  Scanning tunneling potentiometry , 1986 .

[36]  Lukas Rosenthaler,et al.  Observation of magnetic forces by the atomic force microscope , 1987 .

[37]  X. Xie,et al.  Near-field fluorescence microscopy based on two-photon excitation with metal tips , 1999 .

[38]  E. Synge XXXVIII. A suggested method for extending microscopic resolution into the ultra-microscopic region , 1928 .

[39]  P. H. Cutler,et al.  Mechanisms of current rectification in an STM tunnel junction and the measurement of an operational tunneling time , 1989 .

[40]  C. Schönenberger,et al.  Understanding magnetic force microscopy , 1990 .

[41]  E. Synge,et al.  XXIII. An application of piezo-electricity to microscopy , 1932 .

[42]  W. Denk,et al.  Optical stethoscopy: Image recording with resolution λ/20 , 1984 .

[43]  Alvarado,et al.  Observation of single charge carriers by force microscopy. , 1990, Physical review letters.

[44]  T. D. Harris,et al.  Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale , 1991, Science.

[45]  H. K. Wickramasinghe,et al.  Semiconductor characterization by scanning force microscope surface photovoltage microscopy , 1991 .

[46]  H. K. Wickramasinghe,et al.  Scanning thermal profiler , 1986 .

[47]  J. A. Støvneng,et al.  Thermopower in scanning-tunneling-microscope experiments , 1990 .

[48]  James K. Gimzewski,et al.  Enhanced Photon Emission in Scanning Tunnelling Microscopy. , 1989 .

[49]  D. Royer,et al.  Improved Version of a Polarized Beam Heterodyne Interferometer , 1985, IEEE 1985 Ultrasonics Symposium.

[50]  P. Apell,et al.  Theory for light emission from a scanning tunneling microscope , 1990 .