Progress in scanning probe microscopy
暂无分享,去创建一个
[1] D. Sarid,et al. Compact scanning-force microscope using a laser diode. , 1988, Optics letters.
[2] H. K. Wickramasinghe,et al. High Resolution Thermal Microscopy , 1986, IEEE 1986 Ultrasonics Symposium.
[3] Y. Martin,et al. Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution , 1995, Science.
[4] Hemantha K. Wickramasinghe,et al. High‐resolution magnetic imaging of domains in TbFe by force microscopy , 1988 .
[5] H. Kumar Wickramasinghe,et al. High‐resolution capacitance measurement and potentiometry by force microscopy , 1988 .
[6] Albert V. Baez. Is Resolving Power Independent of Wavelength Possible? An Experiment with a Sonic “Macroscope” , 1956 .
[7] R. Feenstra,et al. Tunneling spectroscopy of the GaAs(110) surface , 1987 .
[8] J. E. Stern,et al. Deposition and imaging of localized charge on insulator surfaces using a force microscope , 1988 .
[9] Stroscio,et al. Electronic structure of the Si(111)2 x 1 surface by scanning-tunneling microscopy. , 1986, Physical review letters.
[10] M. Isaacson,et al. Development of a 500 Å spatial resolution light microscope: I. light is efficiently transmitted through λ/16 diameter apertures , 1984 .
[11] E. Abbe. Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung , 1873 .
[12] H. K. Wickramasinghe,et al. ATOMIC FORCE MICROSCOPY OF WORK FUNCTIONS ON THE NANOMETER SCALE , 1999 .
[13] Bruce J. Hunt,et al. The Continuous Wave: Technology and American Radio, 1900-1932 , 1985 .
[14] H. K. Wickramasinghe,et al. Microscopy of chemical-potential variations on an atomic scale , 1990, Nature.
[15] Yves Martin,et al. High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry , 1988, Photonics West - Lasers and Applications in Science and Engineering.
[16] Suzuki,et al. Generation of microwave radiation in the tunneling junction of a scanning tunneling microscope. , 1990, Physical review. B, Condensed matter.
[17] R. F. Humphryes,et al. Acoustic-surface-wave amplitude and phase measurements using laser probes , 1972 .
[18] Hemantha K. Wickramasinghe,et al. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale , 1987 .
[19] J. M. Drake,et al. Special Issue: Dynamics of Molecular Systems , 1990 .
[20] H. K. Wickramasinghe,et al. Optical absorption microscopy and spectroscopy with nanometre resolution , 1989, Nature.
[21] C. Quate,et al. Atomic resolution with the atomic force microscope on conductors and nonconductors , 1988 .
[22] D. Sarid. Scanning Force Microscopy: With Applications To Electric, Magnetic, And Atomic Forces , 1991 .
[23] D. Thompson,et al. Review of Progress in Quantitative Nondestructive Evaluation , 1982 .
[24] Y. Martin,et al. Optical data storage read out at 256 Gbits/in.2 , 1997 .
[25] E. Ash,et al. Super-resolution Aperture Scanning Microscope , 1972, Nature.
[26] H. K. Wickramasinghe,et al. Kelvin probe force microscopy , 1991 .
[27] D. Abraham,et al. High resolution atomic force microscopy potentiometry , 1991 .
[28] Y. Martin,et al. Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution , 1987 .
[29] J. O'keefe,et al. Resolving Power of Visible Light , 1956 .
[30] R. Wiesendanger. Scanning Probe Microscopy and Spectroscopy: Contents , 1994 .
[31] Hamers,et al. Atomically resolved carrier recombination at Si(111)-7 x 7 surfaces. , 1990, Physical review letters.
[32] J. E. Stern,et al. Force microscopy of magnetization patterns in longitudinal recording media , 1988 .
[33] Bell,et al. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy. , 1988, Physical review letters.
[34] Wild,et al. Near-field optical spectroscopy of individual molecules in solids. , 1994, Physical review letters.
[35] Paul Muralt,et al. Scanning tunneling potentiometry , 1986 .
[36] Lukas Rosenthaler,et al. Observation of magnetic forces by the atomic force microscope , 1987 .
[37] X. Xie,et al. Near-field fluorescence microscopy based on two-photon excitation with metal tips , 1999 .
[38] E. Synge. XXXVIII. A suggested method for extending microscopic resolution into the ultra-microscopic region , 1928 .
[39] P. H. Cutler,et al. Mechanisms of current rectification in an STM tunnel junction and the measurement of an operational tunneling time , 1989 .
[40] C. Schönenberger,et al. Understanding magnetic force microscopy , 1990 .
[41] E. Synge,et al. XXIII. An application of piezo-electricity to microscopy , 1932 .
[42] W. Denk,et al. Optical stethoscopy: Image recording with resolution λ/20 , 1984 .
[43] Alvarado,et al. Observation of single charge carriers by force microscopy. , 1990, Physical review letters.
[44] T. D. Harris,et al. Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale , 1991, Science.
[45] H. K. Wickramasinghe,et al. Semiconductor characterization by scanning force microscope surface photovoltage microscopy , 1991 .
[46] H. K. Wickramasinghe,et al. Scanning thermal profiler , 1986 .
[47] J. A. Støvneng,et al. Thermopower in scanning-tunneling-microscope experiments , 1990 .
[48] James K. Gimzewski,et al. Enhanced Photon Emission in Scanning Tunnelling Microscopy. , 1989 .
[49] D. Royer,et al. Improved Version of a Polarized Beam Heterodyne Interferometer , 1985, IEEE 1985 Ultrasonics Symposium.
[50] P. Apell,et al. Theory for light emission from a scanning tunneling microscope , 1990 .