Using X-ray microbeam diffraction to study the long-range internal stresses in aluminum processed by ECAP
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M. E. Kassner | L. Levine | T. Langdon | T. Phan | J. Tischler | P. Geantil | I-Fang Lee | Yi Huang | I. Lee
暂无分享,去创建一个
M. E. Kassner | L. Levine | T. Langdon | T. Phan | J. Tischler | P. Geantil | I-Fang Lee | Yi Huang | I. Lee