论文信息 - Aluminium incorporation in AlxGa1 − xN/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction - 字舞流文

Aluminium incorporation in AlxGa1 − xN/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction

M. Poisson | A. Braña | R. Gago | A. Redondo-Cubero | U. Kreissig | E. Muñoz | F. Gonzalez-Posada | A. F. Braña | F. Gonzalez‐Posada