Improved bi‐mesa structures optimized for resonator mounting

An improved bi-mesa structure optimized for resonator mounting is proposed. To evaluate mounting influences, the frequency differences between clamped and free X-edge conditions are calculated using a two-dimensional finite element method in the X–Y′ region. When the outer mesa height was lower than 20% of the thick area, the frequency differences are less than 10% of standard-type bi-mesa resonator values. These results indicate that the improved bi-mesa structure has good separation from the mounting influences. © 2012 Wiley Periodicals, Inc. Electron Comm Jpn, 95(9): 54–60, 2012; Published online in Wiley Online Library (wileyonlinelibrary.com). DOI 10.1002/ecj.11385